On the origin and elimination of macroscopic defects in MBE films

Journal of Crystal Growth

Volumn 51, Issue 2, 1981, Pages 299-303

  Wood, C E C ^a   Rathbun, L ^a   Ohno, H ^a   DeSimone, D ^a  

^a Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042646107     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(81)90314-6     Document Type: Article

References (9)

1. Ultra low resistance ohmic contacts to n-GaAs