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Volumn 68, Issue 6, 1999, Pages 631-635
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Super-lateral-growth regime analysis in long-pulse-duration excimer-laser crystallization of a-Si films on SiO2
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS FILMS;
AMORPHOUS SILICON;
COMPUTER SIMULATION;
CRYSTAL GROWTH;
CRYSTAL MICROSTRUCTURE;
EXCIMER LASERS;
LASER PULSES;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SILICA;
LASER INDUCED CRYSTALLIZATION;
LONG PULSE DURATION;
SUPER LATERAL GROWTH;
CRYSTALLIZATION;
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EID: 0032633469
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s003390050952 Document Type: Article |
Times cited : (11)
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References (14)
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