Surface morphology and kinetic roughening of Ag on Ag(111) studied with scanning tunneling microscopy

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 54, Issue 1, 1996, Pages 349-353

  Heyvaert, I ^a   Krim, J ^a   Van Haesendonck, C ^a   Bruynseraede, Y ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; MATHEMATICAL MODELS; MOLECULAR BEAM EPITAXY; MORPHOLOGY; ROUGHNESS MEASUREMENT; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; SURFACE ROUGHNESS; SURFACES;

FILM THICKNESS; THREE DIMENSIONAL ISLANDS; TOPOGRAPHY;

SILVER;

EID: 0030193584     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.54.349     Document Type: Article

References (27)

1. P. Meakin, Phys. Rep.235, 189 (1993).
2. F. Family, Physica A168, 561 (1990).
3. Fractal Growth Phenomena, edited by T. Vicsek (World Scientific, Singapore, 1989).
4. The Fractal Geometry of Nature, edited by B. B. Mandelbrot (W. H. Freeman and Co., San Francisco, 1982).
5. J. Krim and G. Palasantzas, Int. J. Mod. Phys. B9, 599 (1995).
6. H.-N. Yang, A. Chan and G.-C. Wang, J. Appl. Phys.74, 101 (1993);
7. H.-N. Yang and T.-M. Lu, Phys. Rev. B51, 2479 (1995).
8. I. Heyvaert, K. Temst, C. Van Haesendonck and Y. Bruynseraede, J. Vac. Sci. Technol. B14, 1121 (1996).
9. F. Family and T. Vicsek, J. Appl. Phys. A18, L75 (1985).
10. F. Family, Physica A168, 561 (1990).
11. S. F. Edwards and D. R. Wilkinson, Proc. R. Soc. London A381, 17 (1982).
12. H. You, R. P. Chiarello, H. K. Kim and K. G. Vandervoort, Phys. Rev. Lett.70, 2900 (1993).
13. G. Palasantzas and J. Krim, Phys. Rev. Lett.73, 3564 (1994).
14. A. Iwamoto, T. Yoshinobu and H. Iwasaki, Phys. Rev. Lett.72, 4025 (1994).
15. C. Thompson, G. Palasantzas, Y. P. Feng, S. K. Sinha and J. Krim, Phys. Rev. B49, 4902 (1994).
16. K. Fang, T.-M. Lu and G.-C. Wang, Phys. Rev. B49, 8331 (1994).
17. S. Buchholz, H. Fuchs and J. P. Rabe, J. Vac. Sci. Technol. B9, 857 (1991).
18. J. Krim, I. Heyvaert, C. Van Haesendonck and Y. Bruynseraede, Phys. Rev. Lett.70, 57 (1993).
19. J. Villain, J. Phys. (France) I1, 19 (1991).
20. G. Rosenfeld, R. Servaty, C. Teichert, B. Poelsema and G. Comsa, Phys. Rev. Lett.71, 895 (1993).
21. J. Vrijmoeth, H. A. van der Vegt, J. A. Meyer, E. Vlieg and R. J. Behm, Phys. Rev. Lett.72, 3843 (1994).
22. H. A. van der Vegt, H. M. van Pinxteren, M. Lohmeier, E. Vlieg, and J. M. C. Thornton, Phys. Rev. Lett.68, 3335 (1992).
23. Z.-W. Lai and S. Das Sarma, Phys. Rev. Lett.66, 2348 (1991).
24. D. E. Wolf and J. Villain, Europhys. Lett.13, 389 (1990).
25. M. D. Johnson, C. Orme, A. W. Hunt, D. Graff, J. Sudijono, L. M. Sander and B. G. Orr, Phys. Rev. Lett.72, 116 (1994).
26. M. Siegert and M. Plischke, Phys. Rev. Lett.73, 1517 (1994).
27. H.-J. Ernst, F. Fabre, R. Folkerts and J. Lapujoulade, Phys. Rev. Lett.72, 112 (1994).