Reliability driven module generation for analog layouts

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 6, Issue , 1999, Pages

  Wolf, M ^a   Kleine, U ^a  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CONSTRAINTS; VOLTAGE DROP;

CONSTRAINT THEORY; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTROMIGRATION; INTEGRATED CIRCUIT LAYOUT; INTERCONNECTION NETWORKS;

LINEAR INTEGRATED CIRCUITS;

EID: 0032629282     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (16)

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