AFM characterization of the structure of Au-colloid monolayers and their chemical etching

Thin Solid Films

Volumn 340, Issue 1, 1999, Pages 183-188

  Doron, Amihood ^a   Joselevich, Ernesto ^a   Schlittner, Anat ^a   Willner, Itamar ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; COLLOIDS; ETCHING; GOLD; MICROMACHINING; MORPHOLOGY; NANOSTRUCTURED MATERIALS; REACTION KINETICS; SURFACE ROUGHNESS; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

NANOCHEMISTRY; TRIETHOXY PROPYLAMINOSILANE;

MONOLAYERS;

EID: 0032628328     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01358-3     Document Type: Article

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