Brightness measurements of a ZrO/W Schottky electron emitter in a transmission electron microscope

Applied Surface Science

Volumn 146, Issue 1, 1999, Pages 357-362

  Fransen, M J ^a,b   Overwijk, M H F ^a   Kruit, P ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTRIC POTENTIAL; ELECTRON DIFFRACTION; ELECTRON EMISSION; ELECTRON MICROSCOPES; ELECTRON OPTICS; LENSES; THERMIONIC EMISSION; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN; ZIRCONIA;

FIELD EMISSION; SCHOTTKY ELECTRON EMITTERS;

ELECTRON SOURCES;

EID: 0032625588     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00025-2     Document Type: Article

References (14)

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