Formation and evaluation of self-assembled monolayers derived from conjugated silylthiophene derivatives

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 445-450

  Choi, Nami ^a   Ishida, Takao ^a   Inoue, Atsuhisa ^a   Mizutani, Wataru ^b,c   Tokumoto, Hiroshi ^b,c  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b NATL INST FOR ADV INTERDISC RES   (Japan)

^c ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

Atomic force microscopy; Conductive molecule; Self assembled monolayer; Silicon oxide; Thiophene derivatives; X ray photoelectron spectra

Indexed keywords

ABSORPTION SPECTROSCOPY; ANGLE MEASUREMENT; AROMATIC COMPOUNDS; ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MOLECULAR STRUCTURE; SOLUBILITY; SYNTHESIS (CHEMICAL); X RAY PHOTOELECTRON SPECTROSCOPY;

CONDUCTIVE DENSITY; MOLECULAR DENSITY; SELF ASSEMBLED MONOLAYERS; SILYLTHIOPHENE DERIVATIVES; WATER CONTACT ANGLE MEASUREMENT;

MONOLAYERS;

EID: 0032625049     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00839-3     Document Type: Article

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