Accurate modeling of simultaneous switching noise in low voltage digital VLSI

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 6, Issue , 1999, Pages

  Song, Sang Won ^a   Ismail, Mohammed ^a   Moon, Gyu ^a   Kim, Dong Yong ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SIMULTANEOUS SWITCHING NOISE (SSN);

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DIGITAL INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; SEMICONDUCTOR DEVICE MODELS;

VLSI CIRCUITS;

EID: 0032624104     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)

1. Srinivasa R. Vemuru, "Accurate Simultaneous Switch-ing Noise Estimation Including Velocity-Saturation Effects", IEEE Transactions on Components, Packaging, and Manufacturing Technology-Part B, pp. 344-349, May 1996.
2. Arun Vaidyanath and Birgir Thoroddsen and J.L. Prince, "Effect of CMOS driver loading conditions on simultaneous switching noise", IEEE Transactions on Components, Packaging, and Manufacturing Technology-Part B, pp. 480-485, Nov. 1994.
3. A.J. Rainal, "Computing inductive noise of chip packages", AT & T BELL Laboratories Technical Journal, pp. 177-195, Jan. 1984.
4. George A. Katopis, "Delta-i Noise Specification for a High-performance Computing Machine", Proceedings of IEEE, pp. 1405-1415, Sep. 1985.
5. R. Senthinathan and J.L. Prince, "Simultaneous Switching Ground Noise Calculation for Packaged CMOS Devices", IEEE Journal of Solid-State Circuits, pp. 724-1728, Nov. 1991.
6. H.C. Lin and L.W. Linholm, "An Optimized Output Stage for MOS Integrated Circuits", IEEE Journal of Solid-State Circuits, pp. 106-109, Apr. 1975.
7. T. Sakurai and A. Newton, "Alpha-power law MOS-FET model and its applications to CMOS inverter de-lay and other formulas", IEEE Journal of Solid-State Circuits, pp. 584-594, Apr. 1990.
8. Sang Won Song, "New Simultaneous Switching Noise Model for Low Voltage Submicron CMOS VLSI", Master's Thesis, The Ohio State University, pp. 16-17, 1998.