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Volumn 266, Issue 1-2, 1999, Pages 205-210

Structure of silicon processed by severe plastic deformation

Author keywords

Nanocrystalline silicon; Severe plastic deformation

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; PLASTIC DEFORMATION; RAMAN SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0032623853     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(99)00030-1     Document Type: Article
Times cited : (63)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.