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Volumn 266, Issue 1-2, 1999, Pages 205-210
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Structure of silicon processed by severe plastic deformation
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Author keywords
Nanocrystalline silicon; Severe plastic deformation
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Indexed keywords
CRYSTAL DEFECTS;
CRYSTAL LATTICES;
CRYSTAL STRUCTURE;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
NANOSTRUCTURED MATERIALS;
PHOTOLUMINESCENCE;
PLASTIC DEFORMATION;
RAMAN SPECTROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
ELASTIC STRAIN;
MICRODISTORTIONS;
SILICON;
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EID: 0032623853
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/s0921-5093(99)00030-1 Document Type: Article |
Times cited : (63)
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References (16)
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