Comparison of mechanically ruled versus holographically varied line-spacing gratings for a soft-x-ray flat-field spectrograph

Applied Optics

Volumn 38, Issue 19, 1999, Pages 4001-4003

  Yamazaki, Takashi ^a   Gullikson, Eric ^b   Miyata, Noboru ^c   Koike, Masato ^a   Harada, Yoshihisa ^d   Kleineberg, Ulf ^b   Underwood, James H ^b   Yanagihara, Mihiro M ^c   Sano, Kazuo ^d  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c TOHOKU UNIVERSITY   (Japan)

^d SHIMADZU CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HOLOGRAPHY; IMAGING SYSTEMS; OPTICAL RECORDING; OPTICAL RESOLVING POWER; PHOTODETECTORS; REACTIVE ION ETCHING; WAVEFRONTS; X RAY SPECTROGRAPHS;

HOLOGRAPHIC GRATINGS;

DIFFRACTION GRATINGS;

EID: 0032621191     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.004001     Document Type: Article

References (12)

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