Facet temperature distribution in broad stripe high power laser diodes

Applied Physics Letters

Volumn 75, Issue 10, 1999, Pages 1467-1469

  Hayakawa, Toshiro ^a  

^a FUJIFILM CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT LOSSES; HIGH POWER LASERS; LIGHT MODULATION; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT;

BROAD STRIPE HIGH POWER LASERS;

QUANTUM WELL LASERS;

EID: 0032620346     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124727     Document Type: Article

References (17)

1. H. Brugger and P. W. Epperlein, Appl. Phys. Lett. 56, 1049 (1990).
2. W. C. Tang, H. J. Rosen, P. Vettiger, and D. J. Webb, Appl. Phys. Lett. 58, 557 (1991).
3. F. U. Herrmann, S. Beeck, G. Abstreiter, C. Hanke, C. Hoyler, and L. Korte, Appl. Phys. Lett. 58, 1007 (1991).
4. G. Abstreiter, Appl. Surf. Sci. 50, 73 (1991).
5. I. Rechenberg, A. Hopner, J. Maege, A. Klein, G. Beister, and M. Weyers, in Proceedings of Microscopic Semiconductor Materials Conference, IOP Conference Series (IOP, London, 1995), Vol. 146, p. 587.
6. P. W. Epperlein, in Proceedings of 17th International Symposium of Gallium Arsenide and Related Compounds, IOP Conference Series (IOP, London, 1990), Vol. 112, p. 633.
7. P. W. Epperlein, Jpn. J. Appl. Phys., Part 1 32, 5514 (1993).
8. P. W. Epperlein and G. L. Bona, Appl. Phys. Lett. 62, 3074 (1993).
9. P. G. Piva, S. Fafard, M. Dion, M. Buchanan, S. Charbornneau, R. D. Goldberg, and I. V. Mitchell, Appl. Phys. Lett. 70, 1662 (1997).
10. J. M. Rommel, P. Gavrilovic, and F. P. Dabkowski, J. Appl. Phys. 80, 6547 (1996).
11. W. Fang, C. G. Bethea, Y. K. Chen, and S. L. Chuang, IEEE J. Sel. Top. Quantum Electron. 1, 117 (1995).
12. R. Puchert, A. Bärwolff, U. Menzel, A. Lau, M. Voss, and T. Elsaesser, J. Appl. Phys. 80, 5559 (1996).
13. T. Fukunaga, M. Wada, H. Asano, and T. Hayakawa, Jpn. J. Appl. Phys., Part 234, L1175 (1995).
14. D. E. Aspnes, S. M. Kelso, R. A. Logan, and R. Bhat, J. Appl. Phys. 60, 754 (1986).
15. The wavelength of a probe beam is 457.9 nm and the incident angle is zero in Ref. 7.
16. W. Nakwaski, J. Appl. Phys. 64, 159 (1988).
17. R. Solarz, R. Beach, B. Benett, B. Freitas, M. Emanuel, G. Alberecht, B. Comaskey, S. Sutton, and W. Krupke, in Diode Laser Arrays, edited by D. Botez and D. R. Scifres (Cambridge University Press, Cambridge, 1994). Ch. 6, pp. 255-293.