Superconducting tunneling as a probe of sputtered oxide barriers

Applied Physics Letters

Volumn 75, Issue 1, 1999, Pages 127-129

  Platt, C L ^a   Katz, A S ^a   Dynes, R C ^a   Berkowitz, A E ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRODES; ELECTRON TUNNELING; FERROMAGNETIC MATERIALS; LEAD; OXIDES;

SUPERCONDUCTING TUNNELING;

JOSEPHSON JUNCTION DEVICES;

EID: 0032615336     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124297     Document Type: Article

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