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Volumn 24, Issue 14, 1999, Pages 969-971
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Combined scanning optical coherence and two-photon-excited fluorescence microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC WAVE BACKSCATTERING;
FLUORESCENCE;
IMAGING TECHNIQUES;
LASER APPLICATIONS;
LASER BEAMS;
LIGHT SCATTERING;
MULTIPHOTON PROCESSES;
SOLID STATE LASERS;
OPTICAL COHERENCE MICROSCOPY (OCM);
TWO PHOTON EXCITED (TPE) FLUORESCENCE MICROSCOPY;
OPTICAL MICROSCOPY;
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EID: 0032614137
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.24.000969 Document Type: Article |
Times cited : (123)
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References (13)
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