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Journal of Applied Physics

Volumn 85, Issue 10, 1999, Pages 7398-7403

Growth and characterization of PbSe and Pb1-xSnxSe on Si (100)

(4) Sachar, H K a,b Chao, I a McCann, P J a Fang, X M a

a University of Oklahoma (United States)

b MICRON TECHNOLOGY INC (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRACKS; FILM GROWTH; LIQUID PHASE EPITAXY; MOLECULAR BEAM EPITAXY; MORPHOLOGY; PLASTIC DEFORMATION; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR GROWTH; SILICON WAFERS; STRAIN; THERMAL EFFECTS;

BUFFER LAYERS; OPTICAL NOMARSKI MICROSCOPY;

SEMICONDUCTING FILMS;

EID: 0032607438 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.369369 Document Type: Article

Times cited : (24)

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