Displacement measurement and surface profiling using semi-insulating photoconductive semiconductors and linearly frequency-ramped lasers

Applied Physics Letters

Volumn 75, Issue 10, 1999, Pages 1374-1376

  Jin, Feng ^a   Khurgin, Jacob B ^a   Trivedi, Suhdir ^b   Wang, Chen Chia ^b   Gad, Esam ^c  

^a Johns Hopkins University   (United States)

^b BRIMROSE CORPORATION OF AMERICA   (United States)

^c USASSDC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAMS; OPTICAL RESOLVING POWER; PHOTOCONDUCTING MATERIALS; PHOTOCURRENTS; REFLECTOMETERS; SURFACE MEASUREMENT;

DISPLACEMENT MEASUREMENT; LINEARLY FREQUENCY-RAMPED LASERS; SEMI-INSULATING PHOTOCONDUCTIVE SEMICONDUCTORS; SURFACE PROFILING;

OPTICAL SENSORS;

EID: 0032606853     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124698     Document Type: Article

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