Simultaneous measurements of three-dimensional reflectivity distributions in scattering media based on optical frequency-domain reflectometry

Optics Letters

Volumn 23, Issue 18, 1998, Pages 1420-1422

  Hiratsuka, Hajime ^a,b   Kido, Eiji ^b   Yoshimura, Takeaki ^b  

^a KUBOTA CORPORATION   (Japan)

^b KOBE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; DIFFRACTION GRATINGS; INTERFEROMETERS; MIRRORS; NUMERICAL METHODS; OPTICAL BEAM SPLITTERS; OPTICAL FILTERS; OPTICAL SENSORS; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SEMICONDUCTOR LASERS;

MICHELSON INTERFEROMETER; OPTICAL FREQUENCY DOMAIN REFLECTOMETRY; TWO LENS SYSTEMS;

IMAGING SYSTEMS;

EID: 0032529888     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.23.001420     Document Type: Article

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