Thin-film characterization of neutral π-associated assemblies incorporating putative pseudo-rotaxanes

Langmuir

Volumn 15, Issue 17, 1999, Pages 5600-5605

  Lynch, Daniel E ^a   Hamilton, Darren G ^b   Calos, Nicolas J ^c   Wood, Barry ^c   Sanders, Jeremy K M ^b  

^a Institute for Clean Growth and Future Mobility   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC COMPOUNDS; ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY MEASUREMENT; EVAPORATION; MIXTURES; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; STOICHIOMETRY; SURFACE ROUGHNESS; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

BREWSTER ANGLE MICROSCOPY; FILM THICKNESS; ROTAXANES; THERMAL EVAPORATION;

LANGMUIR BLODGETT FILMS;

EID: 0032598451     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9816508     Document Type: Article

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