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Volumn 205, Issue 1, 1999, Pages 59-63
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Deposition and simultaneous etching of Si in the chemical vapor deposition (CVD) process: approach by the charged cluster model
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
EPITAXIAL GROWTH;
MATHEMATICAL MODELS;
NUCLEATION;
PLASMA ETCHING;
SEMICONDUCTING FILMS;
SOLUBILITY;
TEMPERATURE;
CHARGED CLUSTER MODEL;
DENSE DIAMOND FILM;
GAS PHASE NUCLEATION;
RETROGRADE SOLUBILITY;
SEMICONDUCTING SILICON;
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EID: 0032598218
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(99)00247-X Document Type: Article |
Times cited : (29)
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References (16)
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