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Volumn 205, Issue 1, 1999, Pages 59-63

Deposition and simultaneous etching of Si in the chemical vapor deposition (CVD) process: approach by the charged cluster model

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; EPITAXIAL GROWTH; MATHEMATICAL MODELS; NUCLEATION; PLASMA ETCHING; SEMICONDUCTING FILMS; SOLUBILITY; TEMPERATURE;

EID: 0032598218     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00247-X     Document Type: Article
Times cited : (29)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.