Parasitic capacitance of submicrometer MOSFET's

IEEE Transactions on Electron Devices

Volumn 46, Issue 9, 1999, Pages 1895-1900

  Suzuki, Kunihro ^a,b  

^a IEEE

^b FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRODES; GATES (TRANSISTOR); OXIDES; SEMICONDUCTOR DEVICE MODELS;

KAMCHOUCHI MODEL;

MOSFET DEVICES;

EID: 0032595355     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.784191     Document Type: Article

References (17)

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