Recent Progress in Low Temperature Calorimetry

Journal of Thermal Analysis and Calorimetry

Volumn 56, Issue 2, 1999, Pages 655-671

  Gmelin, E ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

calorimetry; low temperature techniques; review

Indexed keywords

CALORIMETERS; CALORIMETRY; THERMOANALYSIS;

ADIABATIC CONDITIONS; HIGH RESOLUTION; ISOPERIBOL; LOW TEMPERATURE TECHNIQUES; LOW-TEMPERATURE CALORIMETRY; MICRO-CALORIMETERS; RECENT PROGRESS;

TEMPERATURE; CALORIMETRY;

MICROCALORIMETRY; SCANNING CALORIMETRY;

EID: 0032595259     PISSN: 13886150     EISSN: 15882926     Source Type: Journal    
DOI: 10.1023/A:1010133517896     Document Type: Article

References (71)

1. E. Gmelin, Thermochim. Acta, 29 (1979) 1. DOI: 10.1016/0040-6031(79)85018-2
2. E. Gmelin, Thermochim. Acta, 110 (1987) 183. DOI: 10.1016/0040-6031(87)88226-6
3. G. R. Stewart, Rev. Sci. Instrum., 54 (1983) 1. DOI: 10.1063/1.1137207
4. M. Sorai, K. Kaji and Y. Kaneko, J. Chem. Thermodyn., 24 (1992) 167; T. Matsuo and H. Suga, Thermochim. Acta, 88 (1985) 149. DOI: 10.1016/S0021-9614(05)80046-1
5. F. Gronvold, J. Chem. Thermodyn., 25 (1993) 25.
6. I. Wadsö, Thermochim. Acta, 300 (1997) 1. DOI: 10.1016/S0040-6031(96)03130-9
7. E. Gmelin, Thermochim. Acta, 304/305 (1997) 1. DOI: 10.1016/S0040-6031(97)00126-3
8. A. Eucken, Z. Phys., 10 (1909) 586; W. Nernst, Sitzb. Kgl. Preuss. Akad. Wiss., 12 (1910) 261.
9. E. F. Westrum, Jr., G. Furukawa and J. P. McCullough, in Experimental Thermodynamics, Vol. 1, ed. J. P. McCullough and D. W. Scott, Butterworths, London 1968, p. 133.
10. The lower temperature limit for the commercially available DSC and TMDSC equipment, offered by the companies well known among thermoanalysts — Linseis, Mettler, Netzsch, Perkin-Elmer, Seiko, Setaram, TA-Instruments — is around 100 K. A commercial low temperature calorimeter working, according to the pulse-heat (relaxation time) method, down to and below 4 K is now offered by Oxford Instruments, Oxon OX8 1TL/England.
11. D. A. Ditmars, S. Ishihara, S. S. Chang, G. Bernstein and E. West, J. Res. Natl. Bur. Stands., 87 (1982) 159.
12. D. L. Martin, Rev. Sci. Instrum., 58 (1987) 639. DOI: 10.1063/1.1139230
13. R. Bachmann, F. J. di Salvo and T. H. Geballe et al., Rev. Sci. Instrum., 43 (1972) 205. DOI: 10.1063/1.1685596
14. P. F. Sullivan and G. Seidel, Phys. Rev., 173 (1968) 679; J. E. Graebner, Rev. Sci. Instrum., 60 (1989) 1123. DOI: 10.1103/PhysRev.173.679
15. A. Junod, J. Phys. E: Sci. Instrum., 12 (1979) 945. DOI: 10.1088/0022-3735/12/10/015
16. M. Rajeswari and A. K. Raychaudhuri, Europhys. Lett., 10 (1989) 153.
17. S. Riegel and G. Weber, J. Phys. E: Sci. Instrum., 19 (1986) 790. DOI: 10.1088/0022-3735/19/10/006
18. M. Lysak, P. Day, M. LaMadrid and D. Goostein, Rev. Sci. Instrum., 63 (1992) 5750. DOI: 10.1063/1.1143358
19. W. Schnelle and E. Gmelin, Thermochim. Acta, 269/270 (1995) 27. DOI: 10.1016/0040-6031(94)02666-1
20. J. W. Loram, J. Phys. E: Sci. Instrum., 16 (1983) 367. DOI: 10.1088/0022-3735/16/5/003
21. E. Gmelin and P. Rödhammer, J. Phys. E: Sci. Instrum., 14 (1981) 223. DOI: 10.1088/0022-3735/14/2/018
22. E. Gmelin and K. Ripka, Cryogenics, 21 (1981) 117. DOI: 10.1016/0011-2275(81)90061-8
23. M. Reading, D. Eliott and V. L. Hill, J. Thermal Anal., 40 (1993) 949.
24. Y. H. Jeong, Thermochim. Acta, 304/305 (1997).
25. I. K. Moon, Y. H. Jeong and S. I. Kwun, Rev. Sci. Instrum., 67 (1996) 29; D. H. Jung, T. W. Kwon, D. J. Base, I. K. Moon and Y. H. Yeong, Meas. Sci. Technol., 3 (1992) 475. DOI: 10.1063/1.1146545
26. J. C. van Miltenburg, G. J. K. van den Berg and M. J. van Bommel, J. Chem. Thermodyn., 19 (1987) 1129. DOI: 10.1016/0021-9614(87)90050-4
27. K. Saito, T. Atake and H. Chihara, J. Chem. Thermodyn., 19 (1987) 633. DOI: 10.1016/0021-9614(87)90069-3
28. W. Hemminger und G. Höhne, Grundlagen der Kalorimetrie, Verlag Chemie, Weinheim 1979.
29. J. Rouquerol and W. Zielenkiewicz, Thermochim. Acta, 109 (1986) 121. DOI: 10.1016/0040-6031(86)85014-6
30. U. Rahm and E. Gmelin, J. Thermal. Anal., 38 (1992) 335. DOI: 10.1007/BF01915498
31. J. F. Cochran, C. A. Schiffman and J. E. Neighbor, Rev. Sci. Instrum., 37 (1966) 499. DOI: 10.1063/1.1720226
32. T. Asworth and H. Steeple, Cryogenics, 8 (1968) 225. DOI: 10.1016/0011-2275(68)90028-3
33. J. Pinel and C. Lebau, J. Phys. E.: Sci. Instrum., 5 (1972) 688. DOI: 10.1088/0022-3735/5/7/026
34. R. Lagnier, J. Pierre and M. J. Mortimer, Cryogenics, 17 (1977) 349. DOI: 10.1016/0011-2275(77)90131-X
35. M. Regelsberger, R. Wernhardt and M. Rosenberg, J. Phys. E: Sci. Instrum., 19 (1986) 525. DOI: 10.1088/0022-3735/19/7/005
36. J. P. Shepherd, Rev. Sci. Instrum., 54 (1985) 273. DOI: 10.1063/1.1138343
37. G. W. H. Höhne, W. Hemminger and H.-J. Flammersheim, Differential Scanning Calorimetry, Springer, Berlin 1996.
38. B. Wunderlich, Thermochim. Acta, 300 (1997), and further refs therein; B. Wunderlich, J. Thermal Anal., 48 (1997) 207; J. E. K. Schawe, Thermochim. Acta, 271 (1996) 127, and further refs therein
39. E. Gmelin and S. Sarge, J. Appl. Chem., 67 (1995) 1789. DOI: 10.1351/pac199567111789
40. S. M. Sarge, W. Hemminger, E. Gmelin et al., J. Thermal Anal., 49 (1997) 1125. DOI: 10.1007/BF01996802
41. I. Hatta, Thermochim. Acta, 300 (1997) 7. DOI: 10.1016/S0040-6031(97)00033-6
42. A. Schilling and O. Jcandupcux, Phys. Rev. B, 52 (1995) 9514. DOI: 10.1103/PhysRevB.52.9714
43. F. Fominaya, J. Chaussy and P. Gandit, Rev. Sci. Instrum., 69 (1998) 168; and Rev. Sci. Instrum., 68 (1997) 4191. DOI: 10.1063/1.1148491
44. R. Geer, T. Stoebe, T. Pitchford and C.C. Huang, Rev. Sci. Instrum., 62 (1991) 415. DOI: 10.1063/1.1142136
45. J. F. Jurado, E. Ortiz and R. A. Vargas, Meas. Sci. Technol., 8 (1997) 1151. DOI: 10.1088/0957-0233/8/10/017
46. Y. P. Handa, R. E. Hawkins and J. J. Murray, J. Cgem. Thermodyn., 16 (1984) 623. DOI: 10.1016/0021-9614(84)90042-9
47. I. Tsukushi, O. Yamamuro, K. Sadanami, M. Nishizawa, T. Matsuo and K. Takeda, Rev. Sci. Instrum., 69 (1998) 179. DOI: 10.1063/1.1148493
48. S. Takahara, O. Yamamuro, M. Ishikawa, T. Matsuo and H. Suga, Rev. Sci. Instrum., 69 (1998) 185. DOI: 10.1063/1.1148494
49. A. Junod, E. Bonjour, R. Calemczuk, J. Y. Henry, J. Muller, G. Triscone and J. C. Vallier, Physica C, 211 (1993) 304. DOI: 10.1016/0921-4534(93)90137-F
50. J. P. C. Klaase, Rev. Sci. Instrum., 68 (1997) 89. DOI: 10.1063/1.1147761
51. S. Uma, W. Schnelle and E. Gmelin, private communication.
52. J. Thoen, E. Bloemen, H. Marijnissen and W. van Dael, Proc. 8th Sympos. of Thermophys, Properties, ed. J. V. Sengers, ASME, New York 1982; and J. Thoen, Int. J. Mod. Phys. B, 9 (1995) 2157.
53. G. Pitsi, J. Caerels and J. Thoen, Phys. Rev. B, 55 (1997) 915. DOI: 10.1103/PhysRevB.55.915
54. H. Yao, K. Ema and C. W. Garland, Rev. Sci. Instrum., 69 (1998) 172. DOI: 10.1063/1.1148492
55. N. J. Garfield, M. A. Howson and N. Overend, Rev. Sci. Instrum., 69 (1998) 2045. DOI: 10.1063/1.1148896
56. M. Marone and J. E. Payne, Rev. Sci. Instrum., 68 (1997) 4516. DOI: 10.1063/1.1148423
57. S. Matsuo, Thermochim. Acta, 125 (1988) 307. DOI: 10.1016/0040-6031(88)87230-7
58. S. B. Ota and E. Gmelin, Meas. Sci. Technol., 3 (1992) 1047. DOI: 10.1088/0957-0233/3/11/004
59. V. K. Pecharsky, J. O. Moorman and K. A. Gschneidner, Rev. Sci. Instrum., 68 (1997) 4196. DOI: 10.1063/1.1148367
60. Deepak Varandani, A. K. Bandyopadhyay, V. S. Yadav, E. Gmelin and A. V. Narlikar, Meas. Sci. Technol., 7 (1996) 511. DOI: 10.1088/0957-0233/7/4/007
61. J. Shang Hwang, K. Jan Lin and Cheng Tien, Rev. Sci. Instrum., 68 (1997) 94. DOI: 10.1063/1.1147722
62. J. Lerchner, J. Seidel and G. Wolf, Sensors and Actuators B, 32 (1996) 71. DOI: 10.1016/0925-4005(96)80111-0
63. E. Gmelin, Thermochim. Acta, 310 (1998) 1. DOI: 10.1016/S0040-6031(97)00379-1
64. A. Hammiche and H. Pollock, announcement by Topometrix Comp. in Application News Letter, 96-1 (1996).
65. R. Forster and E. Gmelin, Rev. Sci. Instrum., 67 (1996) 4246. DOI: 10.1063/1.1147576
66. J. R. Barnes, R. J. Stephenson, C. N. Woodburn et al., Rev. Sci. Instrum., 65 (1994) 3793. DOI: 10.1063/1.1144509
67. S. L. Lai, A. G. Ramanath and I. H. Allen, Appl. Phys. Lett., 70 (1997) 43. DOI: 10.1063/1.119299
68. O. Riou, P. Gandit, M. Charalambous and J. Chaussy, Rev. Sci. Instrum., 68 (1997) 1501. DOI: 10.1063/1.1147938
69. G. Lombardi, For better Thermal Analysis, 2nd ed., ICTA (Int. Confed. for Thermal Analysis), Rome 1980.
70. S. Uma, W. Schnelle, E. Gmelin et al., J. Phys.: Condens. Matter, 10 (1998) L33. DOI: 10.1088/0953-8984/10/2/001
71. M. Foldeaki, W. Schnelle, E. Gmelin et al., J. Appl. Phys. 82 (1997) 309. DOI: 10.1063/1.365813