Lateral conduction model for intermolecular interaction of self-assembled monolayers

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 6 B, 1999, Pages 3892-3896

  Mizutani, Wataru ^a,b   Ishida, Takao ^a   Tokumoto, Hiroshi ^a  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON TUNNELING; MATHEMATICAL MODELS; MONOLAYERS; ORGANIC CONDUCTORS; SCANNING TUNNELING MICROSCOPY; SULFUR COMPOUNDS;

INTERMOLECULAR INTERACTIONS; ORGANIC FILMS; SELF ASSEMBLED MONOLAYERS (SAM);

CONDUCTIVE FILMS;

EID: 0032594511     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.3892     Document Type: Article

References (14)

1. T. Ishida, S. Yamamoto, W. Mizutani, M. Motomatsu, H. Tokumoto, H. Hokari, H. Azehara and M. Fujihira: Langmuir 13 (1997) 3261.
2. W. Mizutani, T. Ishida, S.-I. Yamamoto, H. Tokumoto, H. Hokari, H. Azehara and M. Fujihira: Appl. Phys. A 66 (1998) S1257.
3. A. Inoue, W. Mizutani, T. Ishida and H. Tokumoto: Appl. Phys. A 66 (1998) S1241.
4. 13)
5. T. Ishida, W. Mizutani, U. Akiba, K. Umemura, A. Inoue, N. Choi, M. Fujihira and H. Tokumoto: J. Phys. Chem. B 103 (1999) 1686.
6. J. Bardeen: Phys. Rev. Lett. 6 (1961) 57.
7. P. Zeppenfeld, C.P. Lutz and D.M. Eigler: Ultramicroscopy 42-44 (1992) 128.
8. t obtained for Δz ∼0.4 nm.
9. Large spikes were also observed in the STM images of ref. 14, which made quantitative analysis difficult. Our molecules seemed to be more stable, but still made occasional noises. Some of those noises were very difficult to distinguish from the height signal, and we did not exclude these from the plots.
10. For defining σ∥, we need to use the thickness of TP-SAM which was estimated as d = 1.46nm by X-ray photoelectron spectroscopy signal intensities.
11. A. J. Epstein: Mater. Res. Soc. Bull. 22 (1997) 16.
12. G. Drefahl and K. Thalmann: J. Prakt. Chem. 20 (1963) 56.
13. J. H. Chapman and L. N. Owen: J. Chem. Soc. (1950) 579.
14. M. T. Cygan, T. D. Dunbar, J. J. Arnold, L. A. Bumm, N. F. Shedlock, T. P. Burgin, L. Jones II, D. L. Allara, J. M. Tour and P. S. Weiss: J. Am. Chem. Soc. 120 (1998) 2721.