Application of Fourier series methods for studying tunnelling of electrons out of quantum wells in an electric field

Journal of Physics Condensed Matter

Volumn 11, Issue 27, 1999, Pages 5293-5311

  Panda, S ^a   Panda, B K ^a,b   Fung, S ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRON TUNNELING;

ELECTRON ENERGY SHIFTS; FOURIER SERIES METHOD; TUNNELING LIFETIMES;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0032593650     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/11/27/306     Document Type: Article

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