Microstructure of reaction zone at the Ti-AlN interface

Materials Letters

Volumn 40, Issue 4, 1999, Pages 180-186

  Paransky, Y ^a   Berner, A ^a   Gotman, I ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRON DIFFRACTION; MORPHOLOGY; NITRIDES; PHASE COMPOSITION; PROBES; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; TITANIUM; X RAY ANALYSIS;

ALUMINUM NITRIDE; ELECTRON BACKSCATTER DIFFRACTION TECHNIQUES; ELECTRON PROBE X RAY MICROANALYSIS; REACTION ZONE;

INTERFACES (MATERIALS);

EID: 0032592682     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(99)00072-5     Document Type: Article

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