Composition dependence of dielectric anomaly in strontium bismuth tantalate thin films

Materials Research Society Symposium - Proceedings

Volumn 541, Issue , 1999, Pages 235-240

  Takemura, Koichi ^a   Noguchi, Takehiro ^a   Hase, Takashi ^a   Kimura, Hidekazu ^a   Myasaka, Yoichi ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DIELECTRIC FILMS; FERROELECTRICITY; GRAIN SIZE AND SHAPE; PHASE TRANSITIONS; POLARIZATION; STOICHIOMETRY; STRONTIUM COMPOUNDS; TEMPERATURE;

CURIE TEMPERATURE; DIELECTRIC ANOMALY; FILM THICKNESS; REMANENT POLARIZATION; SPONTANEOUS POLARIZATION; STRONTIUM BISMUTH TANTALATE;

THIN FILMS;

EID: 0032592351     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)

1. C. A. Paz de Araujo, J. D. Cuchiaro, L. D. McMillan, M. C. Scott, and J. F. Scott, Nature 374, 627 (1995).
2. K. Amanuma, T. Hase, and Y. Miyasaka, Appl. Phys. Lett. 66, 221 (1995).
3. G. A. Smolemskii, V. A. Isupov, and A. I. Agranovskaya, Sov. Phys. Solid State 3, 651 (1961).
4. E. C. Subbarao, J. Phys. Chem. Solids 23, 665 (1962).
5. J. S. Yang and X. M. Chen, Mater. Lett. 29, 73 (1996).
6. R. E. Newnham, R. W. Wolfe, R. S. Horsey, F. A. Diaz-Colon, and M. I. Kay, Mater. Res. Bull. 8, 1183 (1973).
7. T. Noguchi, T. Hase, and Y. Miyasaka, Jpn. J. Appl. Phys. 35, 4900 (1996).
8. T. Noguchi, T. Hase, and Y. Miyasaka, Integr. Ferroelectr. 17, 57 (1997).
9. K. Takemura, T. Noguchi, T. Hase, Y. Miyasaka, Appl. Phys. Lett. 73, 1649 (1998).
10. H. Kimura, J. Mizuki, S. Kamiyama, and H. Suzuki, Appl. Phys. Lett. 66, 2209 (1995).
11. A. J. Hartmann, C. D. Gutleben, G. J. Foran, C. P. Whitby, R. N. Lamb, C. Isobe, K. Watanabe, and J. F. Scott, Ferroelectr. Lett. 23, 75 (1997).
12. A. D. Rae, J. G. Thompson, and R. L. Withers, Acta. Cryst. B48, 418 (1992).