Dielectric anomaly in strontium bismuth tantalate thin films

Applied Physics Letters

Volumn 73, Issue 12, 1998, Pages 1649-1651

  Takemura, Koichi ^a   Noguchi, Takehiro ^a   Hase, Takashi ^a   Miyasaka, Yoichi ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000031306     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122234     Document Type: Article

References (8)

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