SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 536, Issue , 1999, Pages 57-62

Correlation between defect structures and light emission in Si-nanocrystal doped SiO2 films

(7) Sato, K a Sugiyama, Y a Izumi, T a Ivvase, M a Show, Y a Nozaki, S a Morisaki, H a

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CRYSTAL DEFECTS; LIGHT EMISSION; NANOSTRUCTURED MATERIALS; PARAMAGNETIC RESONANCE; PHOTOLUMINESCENCE; RAPID THERMAL ANNEALING; SEMICONDUCTING SILICON COMPOUNDS;

DEFECT STRUCTURES; PHOTOLUMINESCENCE INTENSITY; SEMICONDUCTOR BANDGAP;

SEMICONDUCTING FILMS;

EID: 0032591616 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Article

Times cited : (11)

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