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Volumn 79, Issue 1-4, 1999, Pages 135-140
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Field emission studies of tungsten-coated silicon-based field emitters
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Author keywords
[No Author keywords available]
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Indexed keywords
TUNGSTEN;
ARTICLE;
CONTROLLED STUDY;
FIELD EMISSION;
FOWLER NORDHEIM THEORY;
IMAGING SYSTEM;
NONHUMAN;
PRESSURE;
SCANNING ELECTRON MICROSCOPY;
TEMPERATURE;
THERMOSTABILITY;
VACUUM;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC INSULATING MATERIALS;
ELECTRON EMISSION;
SILICA;
SILICON;
TUNGSTEN;
FOWLER-NORDHEIM THEORY;
FIELD EMISSION CATHODES;
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EID: 0032586249
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(99)00074-1 Document Type: Article |
Times cited : (12)
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References (18)
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