Multi-atom resonant photoemission: A method for determining near- neighbor atomic identities and bonding

Science

Volumn 281, Issue 5377, 1998, Pages 679-683

  Kay, A ^a   Arenholz, E ^a   Mun, S ^a   Garcia De Abajo F J ^a   Fadley, C S ^a   Denecke, R ^a   Hussain, Z ^a   Van Hove, M A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOM; MOLECULAR INTERACTION; PHOTON; PRIORITY JOURNAL; SPECTROMETER; X RAY ANALYSIS;

EID: 0032584655     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.281.5377.679     Document Type: Article

References (25)

1. E. A. Stern, M. Newville, B. Ravel, Y. Yacoby, D. Haskel, Physica B 208-209, 117 (1995); M. Newville et al., ibid., p. 154; and references therein.
2. E. A. Stern, M. Newville, B. Ravel, Y. Yacoby, D. Haskel, Physica B 208-209, 117 (1995); M. Newville et al., ibid., p. 154; and references therein.
3. M. A. Van Hove, W. H. Weinberg, C.-M. Chan, Low Energy Electron Diffraction (Springer-Verlag, Heidelberg, Germany, 1986).
4. C. S. Fadley et al., Prog. Surf. Sci. 54, 341 (1997), and references therein.
5. U. Fano and J. W. Cooper, Rev. Mod. Phys. 40, 493 (1968).
6. M. O. Krause, T. A. Carlson, A. Fahlman, Phys. Rev. A 30, 1316 (1984), and references therein.
7. L. J. Garvin, E. R. Brown, S. L. Carter, H. P. Kelly, J. Phys. B 16, L269 (1983).
8. A. Tanaka and T. Jo, J. Phys. Soc. Jpn. 63, 2788 (1994), and references therein.
9. M. Weinelt et al., Phys. Rev. Lett. 78, 967 (1997), and references therein.
10. S. M. Butorin, J.-H. Guo, M. Magnuson, P. Kuiper, J. Nordgren, Phys. Rev. B 54, 4405 (1996).
11. Z. Hussain et al., J. Electron Spectrosc. Relat. Phenom. 80, 401 (1996).
12. C. J. Powell, A. Jablonski, S. Tanuma, D. R. Penn, ibid. 68, 605 (1994).
13. C. J. Powell, personal communication.
14. J. Stohr and R. Nakajima, IBM J. Res. Dev. 42, 73 (1998).
15. J. Kortright, unpublihed results for Fe.
16. E. Gullikson, Center for X-ray Optics, Lawrence Berkeley National Laboratory, public access program for calculating x-ray penetration depths and reflectivities available at www-cxro.lbl.gov
17. P. Kuiper, B. G. Searle, P. Rudolf, L. H. Tjeng, C. T. Chen, Phys. Rev. Lett. 70, 1549 (1993).
18. M. A. Brewer et al., Advanced Light Source Compendium of User Abstracts and Technical Reports, Report LBNL-39981, UC-411 (Lawrence Berkeley National Laboratory, Berkeley, CA, 1997), p. 411; K. Krishnan, personal communication.
19. M. A. Brewer et al., Advanced Light Source Compendium of User Abstracts and Technical Reports, Report LBNL-39981, UC-411 (Lawrence Berkeley National Laboratory, Berkeley, CA, 1997), p. 411; K. Krishnan, personal communication.
20. B. T. Thole et al., Phys. Rev. B 32, 5107 (1985).
21. A fuller treatment of MARPE theory is available as supplementary material via the Science Web site at www.sciencemag.org/feature/data/981789.shl
22. F. J. García de Abajo, in preparation.
23. A. Kay, E. Arenholz, S. Mun, C. S. Fadley, data not shown.
24. S. J. L. Billinge, R. G. DiFrancesco, G. H. Kwei, J. J. Neumeier, J. D. Thompson, Phys. Rev. Lett. 77, 715 (1996).
25. We are indebted to M. P. Klein and J. Kortright for helpful discussions, and to S. A. Chambers and K. Krishnan for providing samples. Supported by the Office of Energy Research, Materials Sciences Division, of the U.S. Department of Energy, under contract DE-AC03-76SF00098. Additional support from the Miller Institute (E.A.), the D.F.G.-Germany (R.D.), and the Basque Government (F.J.G.deA.) is also gratefully acknowledged.