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Applied Physics Letters

Volumn 73, Issue 20, 1998, Pages 2995-2997

Observation of ultrahigh-quality crystalline YBa2Cu3Ox in submicron thick films

(4) Lin, Wen Jih a Hatton, Peter D a Baudenbacher, F b Santiso, J b

a DURHAM UNIVERSITY (United Kingdom)

b UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; MAGNETRON SPUTTERING; SUBSTRATES; SURFACE ROUGHNESS; SYNCHROTRON RADIATION; THIN FILMS; TRANSPORT PROPERTIES; X RAY ANALYSIS; X RAY SCATTERING;

BRAGG REFLECTIONS; FULL WIDTH AT HALF MAXIMUM; HIGH ANGLE X RAY MEASUREMENTS;

THICK FILMS;

EID: 0032538707 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.122655 Document Type: Article

Times cited : (4)

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