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Volumn 31, Issue 17, 1998, Pages 2109-2111
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A study on measuring the electromagnetic parameters of chiral materials
a b,c a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANGLE MEASUREMENT;
ELECTROMAGNETISM;
LIGHT REFLECTION;
MAGNETIC PERMEABILITY MEASUREMENT;
PERMITTIVITY MEASUREMENT;
AXIAL RATIO;
CHIRAL MATERIALS;
FREE SPACE OPEN-CIRCUIT METHOD;
FREE SPACE SHORT-CIRCUIT METHOD;
REFLECTION COEFFICIENTS;
OPTICAL MATERIALS;
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EID: 0032494077
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/31/17/006 Document Type: Article |
Times cited : (14)
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References (8)
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