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Volumn 46, Issue 2, 1998, Pages 579-584

Fracture properties of GaAs-AlAs superlattices studied by atomic force microscopy and scanning electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRACTURE MECHANICS; OXIDATION; PLASTIC DEFORMATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SURFACE PROPERTIES;

EID: 0032484304     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(97)00242-5     Document Type: Article
Times cited : (5)

References (14)
  • 11
    • 0003521686 scopus 로고    scopus 로고
    • Springer Series in Optical Sciences, Springer Verlag, Berlin
    • Reimer L., Scanning Electron Microscopy. Springer Series in Optical Sciences, Springer Verlag, Berlin, Vol. 45.
    • Scanning Electron Microscopy , vol.45
    • Reimer, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.