Rare earth concentration in the primary Si crystal in rare earth added Al-21wt.%Si alloy

Scripta Materialia

Volumn 39, Issue 3, 1998, Pages 307-314

  Chang, J Y ^a   Kim, G H ^a   Moon, I G ^a   Choi, C S ^b  

^a Korea Institute of Science and Technology   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; INTERFACIAL ENERGY; MORPHOLOGY; PROBES; RARE EARTH ELEMENTS; SEGREGATION (METALLOGRAPHY); SUPERSATURATION;

ALUMINUM SILICON ALLOYS; ELECTRON PROBE MICROANALYSIS; MORPHOLOGICAL CHANGES;

SILICON ALLOYS;

EID: 0032479069     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(98)00168-7     Document Type: Article

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