Measurements of Al concentration in the primary Si crystals from the rheocast al-15.5 wt% Si alloy

Scripta Materialia

Volumn 37, Issue 7, 1997, Pages 929-936

  Kim, G H ^a   Lee, Jung Ill ^b   Lee, Jae Chul ^a   Lee, Ho In ^a  

^a Korea Institute of Science and Technology   (South Korea)

^b Chungju National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTAL LATTICES; DIFFUSION IN SOLIDS; ELECTRON DIFFRACTION; EUTECTICS; LATTICE CONSTANTS; MICROANALYSIS; MORPHOLOGY; SOLID SOLUTIONS; SOLUBILITY; SUPERSATURATION; THERMAL EFFECTS;

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); ELECTRON PROBE MICROANALYSIS (EPMA);

SILICON ALLOYS;

EID: 0031257325     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(97)00189-9     Document Type: Article

References (11)

1. D.B. Spencer, R. Mehrabian and M.C. Flemings, Met. Trans. 3 (1972) 1925.
2. A. Vogel, R.D. Doherty and B. Cantor, Proc. Int. Conf. on Solidification and Casting of Metals, eds., J. Hunt, Sheffield, The Metals Society, July 18-21, (1979) 518.
3. H.I. Lee, Ph. D. Thesis, Sussex University (1981).
4. J.I. Lee, H.I. Lee and M.I. Kim, Scripta Metall. et Mat., 32 (1995) 1945.
5. T.Z. Kattamis, A.I. Nakhla, Proc. 2nd Int. Conf. on the Semi-Solid Processing of Alloys and Composites, eds., S.B. Brown and M.C. Flemings, Massachusetts, Massachusetts Institute of Technology, (1992) 237.
6. J.L. Murray and A.J. McAlister, Bull. Alloy Phase Diagrams, 5 (1984) 74.
7. Y. Tomokiyo, J. Electron Micros., 41 (1992) 403.
8. J.A. Eades, Acta Microscopia, 1 (1992) 15.
9. J.R. Carruthers, R.B. Hoffman and J.D. Ashner, J. Appl. Phys., 34 (1963) 3389.
10. S.M. Hu, J. Appl. Phy., 45 (1974) 1567.
11. R.M. German, Sintering Theory and Practice, John Wiley and Sons, Inc. (1996) 225.