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Volumn 195, Issue 1-4, 1998, Pages 524-529
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High-quality InAs/GaAs quantum dots grown by low-pressure metalorganic vapor-phase epitaxy
a a a a a a a
a
ORANGE LABS
(France)
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Author keywords
InAs; Microcavity; MOVPE; Photoluminescence; Quantum dots; TEM; X ray diffraction
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Indexed keywords
ELECTRIC VARIABLES MEASUREMENT;
HIGH RESOLUTION ELECTRON MICROSCOPY;
METALLORGANIC VAPOR PHASE EPITAXY;
PHOTOLUMINESCENCE;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR GROWTH;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
INDIUM ARSENIDE;
LOW-PRESSURE METALLORGANIC VAPOR-PHASE EPITAXY;
MICROCAVITIES;
SEMICONDUCTOR QUANTUM DOTS;
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EID: 0032477231
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(98)00580-6 Document Type: Article |
Times cited : (5)
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References (12)
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