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Thin Solid Films

Volumn 332, Issue 1-2, 1998, Pages 305-311

A study on the structural distribution of Se-passivated GaAs surface

(4) Kim, Ji Wan a Sa, Seung Hoon a Kang, Min Gu a Park, Hyung Ho a

a Yonsei University (South Korea)

Author keywords

Angle resolved X ray photoelectron spectroscopy; As Se anion exchange; GaAs; Low energy electron diffraction; Se passivation

Indexed keywords

ANNEALING; ION EXCHANGE; LOW ENERGY ELECTRON DIFFRACTION; PASSIVATION; SEMICONDUCTING SELENIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE-RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0032476348 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(98)01099-2 Document Type: Article

Times cited : (2)

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