Fabrication of high performance CdZnTe strip detector arrays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3553, Issue , 1998, Pages 90-96

  Shi, Z Q ^a   Stahle, C M ^a   Shu, P ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

CdZnTe strip detector; Chemical etching; Energy resolution; Leakage current; Post annealing; Wire bonding

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; COMPOSITION; ETCHING; GAMMA RAYS; LEAKAGE CURRENTS; MORPHOLOGY; SEMICONDUCTING CADMIUM TELLURIDE; TEMPERATURE; X RAY PHOTOELECTRON SPECTROSCOPY;

CADMIUM ZINC TELLURIDE; ENERGY RESOLUTION; INTERSTRIP RESISTANCE; POST ANNEALING; STRIP DETECTOR ARRAYS; WIRE BONDING;

INFRARED DETECTORS;

EID: 0032404644     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.318090     Document Type: Conference Paper

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