X-ray imaging with semiconductor films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3446, Issue , 1998, Pages 102-113

  Shah, K S ^a   Bennett, P ^a   Cirignano, L ^a   Dmitriyev, Y ^a   Klugerman, M ^a   Mandal, K ^a   Moy, L P ^a   Street, R A ^a  

^a RADIATION MONITORING DEVICES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; FLAT PANEL DISPLAYS; LEAD COMPOUNDS; PHOTOCONDUCTING DEVICES; POLYCRYSTALLINE MATERIALS; RADIATION DETECTORS; READOUT SYSTEMS; SEMICONDUCTING FILMS; X RAYS;

DARK CURRENT; LEAD IODIDE; X RAY IMAGING;

IMAGING TECHNIQUES;

EID: 0032404336     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.312883     Document Type: Conference Paper

References (13)

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