Measurements of index of refraction in the deep and vacuum ultraviolet using the minimum deviation method

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3425, Issue , 1998, Pages 188-195

  Burnett, John H ^a   Gupta, Rajeev ^a   Griesmann, Ulf ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Calcium fluoride; Dispersion; Fused silica; Index of refraction; Refractive index

Indexed keywords

CALCIUM COMPOUNDS; ELECTROMAGNETIC DISPERSION; FUSED SILICA; GONIOMETERS; THERMAL EFFECTS; ULTRAVIOLET RADIATION; ULTRAVIOLET SPECTROMETERS;

DEEP ULTRAVIOLET RADIATION;

REFRACTIVE INDEX;

EID: 0032401406     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.326665     Document Type: Conference Paper

References (8)

1. Interspecimen comparison of the refractive index of fused silica
2. A Redetermination of some optical properties of calcium fluoride
3. Refractometry by minimum deviation: Accuracy analysis
4. High current hollow cathode as a radiometric transfer standard source for the extreme vacuum ultraviolet
5. Reference wavelengths from atomic spectra in the range 15 Å to25000 Å
6. An updated Edlén equation for the refractive index of air
7. Measuring efficiency of far ultraviolet optical systems in gaseous nitrogen