Comparison of electrical properties of SrBi2Ta2O9/CeO2/Si and SrBi2Ta2O9/Si structures

Journal of the Korean Physical Society

Volumn 32, Issue 4 SUPPL., 1998, Pages

  Shin, Dong Suk ^a   Han, Yong Hee ^a   Choi, In Hoon ^a   Lee, Ho Nyung ^b   Kim, Yong Tae ^b  

^a Korea University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032396720     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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3. B. M. Melnick, J. Gregory and C. A. Paz-de Araujo, Integ. Ferroelect. 11, 145 (1995).
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5. Y. T. Kim and C. W. Lee, Jpn. J. Appl. Phys. 35, 6153 (1996).
6. T. Nakamura, Y. Nakao, A. Kamisawa and H. Takasu, Appl. Phys. Lett. 65, 1552 (1994).
7. D. S. Shin, Y. H. Han and Y. T. Kim, to be published in Proc. SSDM'97 (1997).