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Journal of the Korean Physical Society

Volumn 32, Issue 4 SUPPL., 1998, Pages

Composition-structure-properties correlation in ferroelectric thin films

(16) Sternberg, A a Tyunina, M a Kundzinsh, M a Zauls, V a Ozolinsh, M a Kundzinsh, K a Shorubalko, I a Kosec, M b Calzada, L c Pardo, L c Alguero, M c Kullmer, R d Bauerle D d Levoska, J e Leppavuori S e Martoniemi, T e

a UNIVERSITY OF LATVIA (Latvia)

b JO EF STEFAN INSTITUTE (Slovenia)

c INSTITUTO DE CIENCIA DE MATERIALES DE MADRID (Spain)

d JOHANNES KEPLER UNIVERSITY LINZ (Austria)

e UNIVERSITY OF OULU (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032396716 PISSN: 03744884 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (3)

References (13)

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