Observation of frequency dependence in the electromechanical properties of ferroelectric thin-layers

Ferroelectrics

Volumn 184, Issue 1-4, 1996, Pages 61-68

  Li, Jie Fang ^a   Viehland, Dwight ^a   Lakeman, C D E ^a   Payne, D A ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FREQUENCIES; HYSTERESIS; INTERFEROMETRY; LEAD COMPOUNDS; PIEZOELECTRICITY; POLARIZATION; SILICON WAFERS; SOL-GELS; SPECTROSCOPY; STRAIN; THIN FILMS;

CLAMPING EFFECT; DIELECTRIC SPECTROSCOPY; LEAD ZIRCONATE TITANATE; POLARIZATION SWITCHING;

FERROELECTRIC MATERIALS;

EID: 0030370478     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199608230245     Document Type: Article

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