Stress-dependent piezoelectric properties of ferroelectric lead zirconate titanate films studied by atomic force microscopy

Journal of the Korean Physical Society

Volumn 32, Issue 4 SUPPL., 1998, Pages

  Zavala, Genaro ^a   Fendler, Janos H ^b   Trolier Mckinstry, Susan ^c  

^a SCHOOL OF ENGINEERING AND SCIENCES   (Mexico)

^b CLARKSON UNIVERSITY   (United States)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032381151     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)

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