Source, optical and detector requirements for X-ray diffraction and scattering

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 645-647

  Nave, Colin ^a  

^a DARESBURY LABORATORY   (United Kingdom)

Author keywords

Beamlines; Detectors; X ray diffraction; X ray scattering

Indexed keywords

EID: 0032375808     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597017317     Document Type: Article

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