News and views: X-ray Topography: An Old Technique with a New Application

Synchrotron Radiation News

Volumn 9, Issue 1, 1996, Pages 25-29

  Siddons, D P ^a   Stojanoff, V ^a   Snell, E H ^b   Helliwell, J R ^b   Scott, John ^c   Abela, R ^d   Hirt, W ^d   Joho, W ^d   Rivkin, L ^d   Weyer, H J ^d   Barr, Susan ^e  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

^c LOUISIANA STATE UNIVERSITY   (United States)

^d PAUL SCHERRER INSTITUTE   (Switzerland)

^e ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85064799635     PISSN: 08940886     EISSN: 19317344     Source Type: Journal    
DOI: 10.1080/08940889608602860     Document Type: Article

References (7)

1. Tanner, B.K., 1976. X‐ray Diffraction Topography, Oxford: Pergamom Press.
2. Stojanoff, V., and Siddons, D.P., 1994. Abstract PK01, Proceedings American Crystallographic Assn. Meeting. 1994, Atlanta, GA, USA.
3. Stojanoff, V., and Siddons, D.P., 1995. Proceedings American Crystal‐lographic Assn. Meeting. 1995, Montréal, Canada. Abstract M132
4. Stojanoff, V., and Siddons, D.P., 1995. Acta Crys. A.
5. Bosch, R., 1992. Journal of Crystal Growth, 122: 310
6. Snell, E.H., in press. Acta Cryst D51.
7. V. Stojanoff et al., to be submitted 1995.