New beamline optics for the effective use of a wiggler beam

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 527-529

  Nakayama, Kan ^a   Okada, Yosimasa ^b   Fujimoto, Hiroyuki ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

Hard X rays; Horizontal diffraction; New beamline optics; Precision goniometry; Wigglers

Indexed keywords

EID: 0032374907     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597016130     Document Type: Article

References (3)

1. Ban, S., Hirayama, H., Namito, Y., Tanaka, S., Nakashima, H., Nakae, Y. & Nariyama, N. (1994). J. Nucl. Sci. Tech. 31, 163-168.
2. Nakayama, K. & Fujimoto, H. (1997). IEEE Trans. Instrum. Meas. 46, 580-583
3. Sasaki, S., Yamamoto, S., Shioya, T. & Kitamura, H. (1989). Rev. Sci. Instrum. 60, 1859-1862.