International collaboration research on the effects of a new theory of plasma X-ray diagnostics using semiconductor X-ray detectors

Plasma Physics Reports

Volumn 24, Issue 3, 1998, Pages 218-221

  Kohagura, J ^a   Cho, T ^a   Hirata, M ^a   Kanke, S ^a   Takahashi, K ^a   Okamura, T ^a   Sakamoto, Y ^a   Tamano, T ^a   Yatsu, K ^a   Miyoshi, S ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032372012     PISSN: 1063780X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

1. Price, W.J., Nuclear Radiation Detection, New York: McGraw-Hill, 1964, ch. 8.
2. Cho, T. et al., Nucl. Instrum. Methods Phys. Res., Sec. A, 1994, vol. 348, p. 475.
3. Kohagura, J. et al., J. Electron Spectrosc. Relat. Phenom., 1996, vol. 80, p. 279.
4. Bessenrodt-Weberpals, M. et al., Soft X-ray Diagnostics for ASDEX Upgrade Max Planck Inst. for Plasma Physics, 1995, IPP 1/290.
5. Wenzel, K.W. et al., Rev. Sci. Instrum., 1988, vol. 59, p. 1380.
6. Lo, D.H. et al., Rev. Sci. Instrum., 1992, vol. 63, p. 4850.
7. Cho, T. et al., J. Plasma and Fusion Research, 1995, vol. 71, p. 62.
8. Hirata, M. et al., Nucl. Instrum. Methods Phys. Res., Sec. B, 1992, vol. 66, p. 479.