A novel analysis method for plasma light and soft X-ray tomography data including the three-dimensional diffusion in a semiconductor detector array

Journal of Electron Spectroscopy and Related Phenomena

Volumn 80, Issue , 1996, Pages 279-282

  Kohagura, J ^a   Cho, T ^a   Hirata, M ^a   Yatsu, K ^a   Tamano, T ^a   Sekitani, T ^b   Hirano, K ^b   Maezawa, H ^b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b Natl Inst for High Energy Physics   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039270564     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(96)02975-1     Document Type: Article

References (9)

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4. K. W. Wenzel and R. D. Petrasso, Rev. Sci. Instrum. 61, 693 (1990).
5. D. H. Lo et al., Rev. Sci. Instrum. 63, 4850 (1992).
6. T. Cho et al., Phys. Rev. A46, 3024 (1992).
7. T. Cho et al., J. Appl. Phys. 72, 3363 (1992).
8. T. Cho et al., Nucl. Instrum. Methods A348, 475 (1994).
9. J. Kohagura et al., Rev. Sci. Instrum. 66, 2317 (1995).