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Volumn 5, Issue 3, 1998, Pages 1026-1028
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Real-time analysis for MBE by time-resolved core-level photoelectron spectroscopy
a
NTT CORPORATION
(Japan)
b
ULVAC PHI Inc
(Japan)
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Author keywords
Core levels; Crystal growth; Real time analysis; Surfaces; Time resolved photoelectron spectroscopy
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Indexed keywords
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EID: 0032363792
PISSN: 09090495
EISSN: None
Source Type: Journal
DOI: 10.1107/S0909049597014799 Document Type: Article |
Times cited : (6)
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References (2)
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