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Volumn 15, Issue 10, 1998, Pages 724-726

Atomic force microscopy on the Ga0.16in0.84As0.80Sb0.20 epilayer grown by metalorganic chemical vapor deposition

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY COMPOUNDS; ARSENIC COMPOUNDS; ATOMIC FORCE MICROSCOPY; EPILAYERS; III-V SEMICONDUCTORS; INDIUM COMPOUNDS; SURFACE DEFECTS;

EID: 0032352176     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/15/10/009     Document Type: Article
Times cited : (1)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.