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Volumn 10, Issue 5, 1998, Pages 287-296

Release-Control Structures for Cantilever-Based Sensors

Author keywords

Anisotropic etching; Commercial CMOS; Release control; Stressed oxide cantilever; Use of fast etch planes

Indexed keywords


EID: 0032332164     PISSN: 09144935     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (7)

References (12)
  • 6
    • 0346083102 scopus 로고    scopus 로고
    • Experimental Investigation of High Si/Al Selectivity during Anisotropic Etching of Si{100} in TMAH
    • Ottawa ONT, Aug. 11-15
    • A. Pandy, L. M. Landsberger, B. Nikpour, M. Paranjape and M. Kahrizi: "Experimental Investigation of High Si/Al Selectivity during Anisotropic Etching of Si{100} in TMAH," Canadian Semiconductor Conference, Ottawa ONT, Aug. 11-15, 1997.
    • (1997) Canadian Semiconductor Conference
    • Pandy, A.1    Landsberger, L.M.2    Nikpour, B.3    Paranjape, M.4    Kahrizi, M.5
  • 11
    • 0020127035 scopus 로고
    • Silicon as a Mechanical Material
    • K. E. Peterson: Silicon as a Mechanical Material, Proc. IEEE, Vol. 70, No. 5 (1982) p. 420.
    • (1982) Proc. IEEE , vol.70 , Issue.5 , pp. 420
    • Peterson, K.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.